We just released tutorial #4 of our Optocomb Suite tutorial series! Tutorial #4 shows you how to leverage the micrometer resolution of Optocomb 3D scanners to automate your visual inspection process. With the Optocomb Detector toolbox, you can use the user-friendly “master sample comparison” method to fully automate your defect recognition process, identify 3D defects and extract quantitative information about burrs, scratches, particles and more.
Learn more about Optocomb Suite by XTIA on our software page and discover how our software can meet your in-line metrology and inspection needs.
